Table 1. Displacement of the printed SILs with respect to the QD position.

radius (μm)	measured (nm)	refraction corrected (nm)
10	1350	850
15	510	400
15	900	650
20	860	460
20	1210	680
25	330	220
25	1350	730
37.5	1270	740

Refraction corrected values show submicrometric accuracy.