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. Author manuscript; available in PMC: 2017 Dec 1.
Published in final edited form as: J Am Soc Mass Spectrom. 2016 Sep 22;27(12):2014–2024. doi: 10.1007/s13361-016-1492-z

Fig 4.

Fig 4

Depth profile of the positive [M + H] + and negative [M − H] − molecular secondary ions of Irganox 1098 (m/z 637 and 635) and Irganox 1010 (m/z 1178 and 1176) across the NPL irganox multilayer measured with an HCl doped 20 keV Ar3k+ (1.25% HCl) cluster ion beam applied for erosion and data acquisition. For a logarithmic plot of all recorded signals see supporting Fig S 5.