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. Author manuscript; available in PMC: 2017 Dec 1.
Published in final edited form as: J Am Soc Mass Spectrom. 2016 Sep 22;27(12):2014–2024. doi: 10.1007/s13361-016-1492-z

Table 2.

Thickness and sputter yield volume under bombardment with 20 keV Ar3k+ cluster ions determined for the individual layers of the irganox multilayer sample as described in the text.

Film Thickness (nm) Sputter yield (nm3)
20 keV Ar3k+ 40 keV C60+
Layer 1 (1098) 105 78 198

Layer 2 (1098/1010) 105 88 202

Layer 3 (1098) 106 77 186

Layer 4 (1010) 104 113 242