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. 2017 Jan 6;12:363–369. doi: 10.2147/IJN.S116105

Figure 1.

Figure 1

SEM images of the (A) untreated titanium, (B) Ti-120, and (C) Ti-160 as well as AFM of (D) untreated titanium, (E) Ti-120, and (F) Ti-160 illustrating the nanoscale surface topography.

Abbreviations: SEM, scanning electron microscopic; AFM, atomic force microscopy; RMS, root-mean-square.