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. 2016 Dec 27;114(2):233–238. doi: 10.1073/pnas.1617186114

Fig. 2.

Fig. 2.

Physical properties of amorphous C12A7:e and ZSO thin films deposited on SiO2 glass substrates by sputtering at RT. (A) Optical absorption spectra and photographs of the thin films. The sample thicknesses are ∼200 nm. A-ZSO is more transparent than a-IGZO for oxide TFTs. (B) Secondary electron emission cutoff spectra measured by UV photoemission spectroscopy (UPS) along with that of ITO for comparison, and (C) work function values of various metals and transparent oxide semiconductors. Mg:Ag(10%) is practically used as the cathode with a combination of a very thin LiF layer such as LiF/Al (29).