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. 2017 Jan 18;7:40787. doi: 10.1038/srep40787

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Copyright © 2017, The Author(s)

This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

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(a–f) AFM images of sonicated and isolated (fraction 18) Un (iUn, a,b), sFib (iFib, c,d), and sLFAO (iLFAO, e,f). Inset) AFM images used for surface analysis. Scale bars for (a,c and e) represent 1 μm, while (b,d,f) and insets represent 200 nm. (g–i) Surface morphology analysis, as indicated by black arrows. The dashed line in panel i represents pLFAO analysis (Fig. 2n). (j) Dynamic light scattering of fractions 18 of iUn, iFib, and iLFAO samples. **represents p < 0.05.