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. 2017 Jan 27;7:41413. doi: 10.1038/srep41413

Table 1. Key features of CL, AL, and CT.

CL AL CT
+High resolution in xy plane. +High resolution in xy plane. +Uniform, but potentially reduced resolution in x, y, z.
−Blurring in z direction. +Medium resolution in z direction, i.e. typical CL artifacts are suppressed to a large degree. −Sample has to fit into the FOV.
+Large geometric magnifications can be achieved. −Increased scanning times. −Strong attenuation for flat, extended objects.
+Reduced attenuation for flat, extended objects.