Fig. 1.

Example 10 $\mathrm{\mu }$m $\times$ 10 $\mathrm{\mu }$m AFM topographic measurements for a Ni, b Co and c NiCo thin films. Each sample had deposited charge of 1000 mC. The scale bar is 2 $\mathrm{\mu }$m for all the images. The vertical scale is indicated to the right and is different for each image. The roughness factors for these images are (a) 1.12, (b) 1.41, and (c) 1.05