Fig. 4.

Example double-layer capacitance measurements for a NiCo thin film. The sample had a deposited charge of 1000 mC. The inset shows CV measurements in 1 M KOH at 75, 225, and 350 mV/s. The slope of the linear fit to the capacitive current, $I_{\mathrm{dl}}$, vs. scan rate, v, is the measured double-layer capacitance, $C_{\mathrm{dl}}$, for the sample