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. 2017 Jan 17;114(5):816–821. doi: 10.1073/pnas.1613110114

Fig. S1.

Fig. S1.

Basic characteristics of the multilayer ZrTe5 flake. (A) Thickness of the ZrTe5 flake characterized by AFM. The multilayer flake studied in the main text has the thickness d ∼ 180 nm. (Inset) An AFM image of the investigated flake. The AFM scan was performed along the blue line in the image. (B) Energy dispersive X-ray spectra of the ZrTe5 flake. The atom ratio, Zr:Te ∼ 1:5.