. 2016 Dec 21;121(1):430–440. doi: 10.1021/acs.jpcc.6b10720

Table 1. Ratios between Peak Areas of XPS Survey Spectra, Corrected for the Intensity of the Photon Beam and Atomic Sensitivities, for Bare and APTES-Functionalized TiO₂ Films^a.

	pristine TiO₂	APTES-TiO₂, 0 min	APTES-TiO₂, 30 min	APTES-TiO₂, 60 min
O/Ti	2.2(1)	2.7(1)	3.0(1)	3.0(1)
C/N	23(2)	4.9(3)	7.1(5)	6.2(4)
N/Si		0.75(5)	0.50(4)	0.34(2)
Si/Ti		0.61(4)	0.45(3)	0.53(4)

Estimated standard deviations are given in parentheses.

Table 1. Ratios between Peak Areas of XPS Survey Spectra, Corrected for the Intensity of the Photon Beam and Atomic Sensitivities, for Bare and APTES-Functionalized TiO2 Filmsa.