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a) Transient photovoltage decay (TPD) data for device A, C in Table 1 and device E with compact‐NiO/meso‐Al2O3/CH3NH3PbI2.85Br0.15/PCBM/BCP/Au configuration with 2.0 wt% incorporation of Au‐nanospheres@SiO2, measured under 0.5% sun illumination. And charge recombination lifetime, b) τ1 and c) τ2, as a function of the open‐circuit voltage, derived from the double exponential fitting of TPD curves.
