Table 2. ID24 beamline main characteristics.
| Beamline name | ID24 |
| Source | U27 1.6 m + U27 1.4 m + Revolver U27/U32 1.4 m + U32 1.6 m |
| Primary slits | 3 mm × 1.5 mm located at 26.8 m |
| Polychromator | Si(111) or Si(311) |
| Mirrors | Two mirrors in KB configuration @ 3 mrad (Pt/Si/Rh coating) |
| Energy range | 5–28 keV |
| Beam size at 7 keV (FWHM) | 3 µm × 3 µm using a Si (111) Bragg polychromator and a vertically refocusing Si mirror at 4.5 mrad |
| Flux on sample at 7 keV | 1 × 1014 photons s−1 at 200 mA with Si(111) Bragg polychromator and two Si KB mirrors at 3 mrad† |
| Beam size at 24 keV (FWHM) | 30 µm × 100 µm (FWHM) using a Si(111) Laue polychromator and no vertically refocusing mirror |
| Flux on sample at 24 keV | 4 × 1013 photons s−1 at 200 mA with Si(111) Laue polychromator and two Pt-coated KB mirrors at 3 mrad |
| Detectors | Two-dimensional FReLoN CCD camera, one-dimensional Hamamatsu CCD camera, XH Ge microstrip detector |
| Sample environments | In situ laser heating for the DAC (P < 300 GPa, T < 5000 K), He-flow cryostat for DAC, high-temperature reactors, plug flow capillary microreactors, DRIFTS spectrometer, stopped-flow cell, UV–Vis spectrometer, pulsed magnetic fields (B < 30 T) and various magnet devices for XMCD and XMLD |
Measured with a calibrated Si diode.