Figure 4.
Measuring microsecond-to-millisecond motions using relaxation dispersion in the rotating frame. Secondary structure (left) and representative RD profiles for (A) ES1 and (B) ES2 in wtTAR35,37 (middle) and ΔC24-wtTAR (right). RD profiles show the dependence of R2 + Rex on spin lock power (ωeff/2π) and offset (Ω/2π) with global fits (—) and individual fits (–) to the two-state Laguerre equation (eq 2).82 Error bars represent experimental uncertainty [one standard deviation (see Methods)].