Fig. 3.

Left The distribution of the smallest of the isolation variables of the two electrons $I_e^{\text{min}}$. Right The distribution of the muon isolation variable $I_{\mathit{\mu }}$. The data for $66\mathrm{GeV}<m_{\ell \ell }<116\mathrm{GeV}$ are compared to the sum of the estimated multi-jet background and all other processes, which are estimated from MC simulation. The red dashed lines indicate the range over which the fit is performed