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. 2017 Feb 14;8:434–439. doi: 10.3762/bjnano.8.46

Figure 2.

Figure 2

(a) Photograph, (b) AFM images, and (c) SEM images (upper row: top view, lower row: fracture cross section) of two Au samples prepared onto Si substrates with σ = 87° (left column) and σ = 75° (right column).