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. 2017 Mar 3;7:43202. doi: 10.1038/srep43202

Figure 1.

Figure 1

XRD with different zirconia content at different annealing temperatures, (a) as synthesized samples, (b) 1000 °C, (c) 1100 °C, (d) 1200 °C, (e) 1300 °C, (*: ZrO1.95, v: α-TCP).