Appendix Table 2.
Parameter | Value |
---|---|
| |
Scanner | GE Discovery CT750 HD |
Scan type | Helical |
Helical pitch | 0.516 |
Rotation time (s) | 0.5 |
Beam collimation (mm) | 40 |
No. of detector rows | 64 |
Detector configuration | 64 × 0.625 |
Scan field of view | Large body |
kV | 120 |
Smart mA min/max mA Range | 60–660 |
Slice thickness for noise index (mm) | 5.0 |
Noise index | 16.3 |
Reconstruction (filtered back projection) | |
Display field of view (cm) | 36–50 |
Reconstruction type | Standard |
Slice thickness (mm) | 2.5 |
Slice interval (mm) | 1.25 |
Window width/level (HU) | 400/50 |
Reconstruction option | Plus |