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. 2017 Mar 6;7:43450. doi: 10.1038/srep43450

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(a) Schematic view of the GIWAXS measurement. The small grazing incidence angle used (α_i = 0.2°) allow to obtain information from the substrate topography. (b) 2D diffraction patterns of PVDF and PVDF-RGO (left) and their corresponding integrated scattered intensity as a function of the scattering vector (right). (c) The deconvolution of the 1D integrated intensity curves. Peak deconvolution and indexing was performed assuming the existence of two different crystalline phases for the pure PVDF matrix in agreement with the Raman characterization.