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. 2017 Mar 7;7:44213. doi: 10.1038/srep44213

Figure 5. The orientation and surface roughness of each grain after etching.

Figure 5

(a) EBSD micrographs and (b) optical profilometry images in the same region on the as-received substrate. Each number points out each grain. (c) Inverse pole figures of normal direction and surface topography (scan area 30 × 30 μm2) with Rq values of each grain.