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. 2017 Mar 8;7:44167. doi: 10.1038/srep44167

Figure 2. Measuring displacement of a SNW using the image analysis method.

Figure 2

(a) Schematic of the diffraction pattern imaging of a SNW in the optical trap under LED light illumination (blue line). (b) Intensity profile of the diffraction pattern around the center position of the particle. The lateral position can be measured by tracking the center in the diffraction pattern image and the vertical position can be calculated from the intensity profile of the diffraction pattern. (c) Displacements of a SNW measured in IP1 and their distributions.