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. 2017 Jan 2;10(1):12. doi: 10.3390/ma10010012

Figure 4.

Figure 4

(a) SEM micrograph of the measured square polymerized structures; (b) RMS calculated for surfaces fabricated with different dx for SZ2080 containing PI and without it; and (c) AFM images of surfaces of pure and photosensitized polymer obtained with highest voxel overlap (dx = 50 nm) as well as one which was produced via homogeneous UV exposure.