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. 2017 Mar 8;8:14658. doi: 10.1038/ncomms14658

Figure 1. Home-built thin infrared sample cell and FTIR spectra.

Figure 1

(a) RF magnetron sputtering method was used to deposit a thin donut-shape SiO2 film on CaF2. The thickness of SiO2 film on CaF2 was measured with scanning electron microscopy (right panel). Scale bar, 500 nm. (b) The linear relationship between the sputtering time and the thickness of SiO2 film was used to control the infrared beam path length. (c) The FT-IR spectra of the C=O stretch and (d) the O–C–O asymmetric stretch of LiPF6 DEC solution at various LiPF6 concentrations.