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. 2017 Mar 13;7:44240. doi: 10.1038/srep44240

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This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

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Schematics of the near-field probe top view (a) and the cross section (b). The electric field E (red arrow in (b)) of the THz wave induces oscillating field between the source (S) and gate (G) electrodes. (c) Scanning electron microscopy (SEM) image of a near-field probe with a 20 μm aperture and an embedded InAs NW as the FET channel. (d) SEM image of a near-field probe with a 20 μm aperture and an embedded flake of black phosphorus (BP).