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. 2017 Mar 10;8:14702. doi: 10.1038/ncomms14702

Figure 2. Structural characterization of the as-synthesized microcarriers.

Figure 2

(ai) TEM images of solid SiO2 particles (a), SiO2-Nd (b,c), SiO2-Nd@SiO2 (d), SiO2-Nd@SiO2@mSiO2 (e,f), SiO2-Nd@SiO2@mSiO2-NH2 (g) and SiO2-Nd@SiO2@mSiO2-NH2@SSPI (h,i). Inset images in c,f,i are the corresponding HRTEM images. (j) Dark-field STEM image of a single SiO2-Nd@SiO2@mSiO2-NH2@SSPI microcarrier and EDXS element mapping of elements Si, Gd and C in one microcarrier. (a,b,d,e,g,h) Scale bars, 500 nm; (c,f,i,j) scale bars, 100 nm; (c) scale bars, inset image 20 nm; and (f,i) scale bars, in the inset images 50 nm.