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. 2017 Mar 22;7:44848. doi: 10.1038/srep44848

Figure 4.

Figure 4

(a) Backscattered SEM micrograph of the N2-annealed Si3N4 sample (the brighter area locates Si-Y-Al-O-N phases); in (b) a comparison between normalized CL spectra collected at locations A and B in (a); and, in (c), the XPS Si 2p photoelectron spectrum revealing the concurrent existence of Si-Si, Si-O, and Si-N bonds.