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. 2017 Mar 29;5(5):19. doi: 10.1007/s40134-017-0213-0

Fig. 3.

Fig. 3

DECT systems. Dual-source dual-energy system (a): two separate X-ray tubes and detectors are orthogonally mounted for simultaneous data acquisition and processing. Each tube can be set at different voltage levels. The kVp settings can be adjusted between 70 and Sn150 kVp for the latest generation dual-source scanner (Siemens). Single-source dual-energy system: switching the kVp setting can generate two spectra. One method is fast kV switching (b), in which one X-ray tube rapidly switches between low and high kVps (GE). The second method is kVp switching between single rotations (c), the so-called dual spiral approach (Toshiba, Siemens). A single detector then processes the information from both voltage levels. Dual-layer system (d): a polychromatic spectrum from one tube passes on to a dual-layer detector. The upper layer is sensitive to the low-energy photons, while the second layer processes the high-energy photons. The combination of both detectors creates the combined image (Phillips). Single-source twin-beam system (e): the single X-ray beam is pre-filtered between the tube and the patient by gold (Au) and tin (Sn) filter. The 120-kVp X-ray beam is split into high- (Sn) and low-energy (Au) spectra (Siemens)