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. 2015 Mar 17;5:9069. doi: 10.1038/srep09069

Figure 5. SEM-micrograph of the surface crystallized layer in a cross section of a transparent sample annealed at 840°C for 5 h superimposed by the IPF+IQ-map of an EBSD-scan.

Figure 5

001-PFs calculated from the entire scan data, the surface layer and the growth front are presented below.