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. 2014 Dec 9;4:7393. doi: 10.1038/srep07393

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(a) The schematic drawing of composition gradient sputtering (CGS) device, and (b) the composition distribution detected by a field emission electron probe microanalyzer. The insets of Figure 1a from top to bottom shows the position distribution for CGS sample S_CGS and the magnetoelectric coupling sample S_ME, and the interaction mechanism of magnetoelectric coupling between CGS film and PZN-PT. The composition distribution of S_ME is marked in the inset of Figure 1b using a red short-dashed box.