Table 1.
GE MR750 (S1) | GE Signa HDxt (S2) | GE Signa PET/MR (S3) | ||
---|---|---|---|---|
GIRF measurement | RF pulse | 24μs hardpulse | 24μs hardpulse | 24μs hardpulse |
Np | 401 | 401 | 401 | |
Flip angle (degree) | 6 | 6 | 6 | |
Slew rate (mTm−1ms−1) | 200 | 118 | 118 | |
# of input gradient | 21 | 15 | 21 | |
Pre-dephaser (mTm−1) | 21.7 | 11.4 | 21.0 | |
Input gradients (mTm−1) | 7~31 | 6.7~20 | 10~30 | |
Spacing (μs) | 464 | 476 | 588 | |
TR(ms) | 4.4 | 4.4 | 4.4 | |
Sampling rate (kHz) | 500 | 250 | 500 | |
# of data points | 988 | 378 | 982 | |
RF Coil | 8-ch receive only head coil | |||
Scan time (sec) | 106 | 75 | 106 | |
3D UTE | 2D Spiral | 3D Ramp sampling | ||
Imaging experiment | RF pulse | 24μs hardpulse | Sinc pulse | 24μs hardpulse |
Flip angle (degree) | 6 | 30 | 6 | |
TE (ms) | 0.09 | 2.42 | Cartesian: 1.06, 1.97, 2.87, 3.77 Ramp sampling: 0.85, 1.49, 2.13, 2.77 |
|
TR (ms) | 3.3 | 13 | Cartesian: 5.2 Ramp sampling: 3.7 |
|
Sampling rate (kHz) | 500 | 250 | 500 | |
# of data points | 415 | 512 | Cartesian: 1234 Ramp sampling: 1830 |
|
# of TR | 80000 | 48 | 101×31 | |
RF coil | 8-ch receive only head coil | Single CH T/R coil | 8-ch receive only head coil | |
Scan time | 4min 28 sec | 0.6 sec | Cartesian: 16.3 sec Ramp sampling: 11.6 sec |
|
SPI-based gradient measurement | Np | 401 | 401 | 401 |
TR (ms) | 3.3 | 13 | 3.7 | |
Reference time, tr (ms) | 0.29 | 2.94 for x-axis 3.18 for y-axis |
21 | |
Sampling rate (kHz) | 500 | 250 | 500 | |
# of data points | 415 | 512 | 1830 | |
RF coil | 8-ch receive only head coil | |||
Scan time | 4sec | quick: 42sec extensive: 385sec |
1.5sec |