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. 2017 Apr 12;7:44397. doi: 10.1038/srep44397

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Copyright © 2017, The Author(s)

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Magnetometry obtained by VSM showing the effect of film thickness of t_FeRh; (a) i thermal hysteresis loops performed with an inplane field of 1kOe showing the AFM(green) to FM(red) regions. Also plotted is the maximum point of the phase transition as a function of the temperature at which that this occurs T_m; (a) ii shows the thermal hysteresis for the 2.5 nm film along with the 10pt Savitzky–Golay filtered and drift corrected data; (a) iii shows the M-H data for the 2.5 nm film taken at an average a temperature of 423 K. The outset (above) shows schematically the magnetic order of the Fe sub-lattices before and after the phase transition in addition to the induced moment on the Rh atom; (b) the extracted normalised transition temperature distribution as a function of film thickness during the heating and cooling cycles; (c) ratio of the magnetization before, M_300K, and after at the maximum point of the phase transition and (d) as a function of film thickness fitted with a quadratic function.

Inline graphic — Magnetometry obtained by VSM showing the effect of film thickness of t_FeRh; (a) i thermal hysteresis loops performed with an inplane field of 1kOe showing the AFM(green) to FM(red) regions. Also plotted is the maximum point of the phase transition as a function of the temperature at which that this occurs T_m; (a) ii shows the thermal hysteresis for the 2.5 nm film along with the 10pt Savitzky–Golay filtered and drift corrected data; (a) iii shows the M-H data for the 2.5 nm film taken at an average a temperature of 423 K. The outset (above) shows schematically the magnetic order of the Fe sub-lattices before and after the phase transition in addition to the induced moment on the Rh atom; (b) the extracted normalised transition temperature distribution as a function of film thickness during the heating and cooling cycles; (c) ratio of the magnetization before, M_300K, and after at the maximum point of the phase transition and (d) as a function of film thickness fitted with a quadratic function.