Fig. 5.

EVL/VASP dKO activated CD4 T cells are competent in shear-resistant adhesion and migration. (A) Schematic of the experimental set-up for measuring T-cell adhesion and motility under physiologic shear forces. (B and C) WT and EVL/VASP dKO T-cell shear-resistant adhesion to ICAM-1 (B), or to VCAM-1 (C). (D and E) Mean WT and dKO T-cell crawling speed under flow on ICAM-1 in the presence of CCL21 (D) or on VCAM-1 in the presence of CCL21 (E). (F) Quantification of WT and dKO T-cell shear-resistant adhesion to TNF-α–activated primary microvascular brain endothelial cells in the presence of CCL21. (G) Detachment of initially adhered T cells from activated endothelial monolayers after shear flow increase from 0.2 to 2 dyne/cm². (H) Hyperadhesiveness of WT and dKO T cells to primary brain endothelial cells, measured as the frequency of adhered T cells that failed to crawl. (I) Mean T-cell crawling speed under shear forces on activated brain endothelial monolayers. (J) Percentage of in vivo adoptively transferred WT and dKO T cells recovered from lymph nodes that remained in the vasculature 2 h posttransfer (identified by intravascular staining). (K) Percentage of transferred T cells recovered from the CNS that remained intravascular, 24 h posttransfer. Data represent the average of a minimum of three independent experiments; error bars are SEM; P values are paired t tests. ns, not significant.