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. Author manuscript; available in PMC: 2018 Apr 1.
Published in final edited form as: Hear Res. 2016 Oct 27;347:28–40. doi: 10.1016/j.heares.2016.10.021

Fig. 8.

Fig. 8

SS induced threshold shift in high-frequency IC multiunit clusters. (A) Frequency receptive field from a representative high-CF IC multiunit cluster pre- and 2 h post-SS. Pre-CF near 27.7 kHz and CF-threshold ~20 dB. Note threshold increase of 20–30 dB around the CF, 10–20 dB at low frequencies, and less than 5 dB at the frequencies of 5.3–12.1 kHz that resulted in a broad tip and slight downshift in tuning. (B) Discharge rate-intensity function of the IC multiunit cluster at 27.7 kHz pre- (black open circles) and 2 h post-SS (red filled circles). Note ~20 dB thresholds shift 2 h post-SS (horizontal arrow) and decrease in suprathreshold firing rates at all levels (down arrow). (C) Discharge rate intensity function at 12.1 kHz of the multiunit cluster; note largely unchanged response amplitude post-SS. (D) Mean (± SEM) frequency receptive fields of 12 high-CF multiunit clusters in IC measured pre- (black open circles) and 2 h post-SS (red filled circles). Note significant SS-induced threshold increases of 10–30 dB around and above the original CF, but insignificant increase at low frequencies.