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. 2017 Apr 20;12:3267–3280. doi: 10.2147/IJN.S135045

Figure 2.

Figure 2

Micro-XAM-3D noncontact profiler surface roughness analysis of the titanium disks.

Notes: (A) Representative Micro-XAM-3D noncontact profiler pictures of the smooth (S), acid-etched microstructured (R), and hierarchical micro-/nanotextured surfaces (R10 and R20) on large scanning areas of 1.8 mm ×1.4 mm and 450 μm ×350 μm, respectively. (B) Comparisons of the roughness parameter (Ra and Rq) of different titanium surfaces. ***P<0.001.

Abbreviations: Ra, average roughness; Rq, root mean square roughness.