Table 2.

Summary of the contributions to the relative systematic uncertainties, corresponding to the 8 TeV dataset, (the sub-total for the 7 TeV dataset is also given). The indicated ranges cover the fully simulated LV models. The detection efficiency is affected by the parton luminosity model and depends upon the production process, with a maximum uncertainty of 7% for the gluon-gluon fusion process $PC$. For the fast simulation based analysis there is an additional contribution of 5%. The systematic effects associated with the signal and background models used in the LLP mass fit are not shown in the table

Source	Contribution (%)
Integrated luminosity	1.2
Muon detection	2.1–4.5
Muon $p_{\mathrm{T}}$ scale	1.5
Muon $d_{\mathrm{IP}}$ uncertainty	0.4–1.2
Vertex reconstruction	2.0
Beam line uncertainty	0.2–1.0
MLP training models	1.5–3.6
Muon isolation	2.2
LLP mass scale	0.8–1.5
Models statistics	1.7–2.5
Sub-total $8\mathrm{TeV}$ dataset	4.9–6.5
(Sub-total $7\mathrm{TeV}$ dataset	4.9–6.1)
Parton luminosity	3–7
Analysis with fast simulation	5