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. 2017 May 9;7:46635. doi: 10.1038/srep46635

Figure 2.

Figure 2

SEM images of SiO2 (a), SiO2-KH570 (c), SiO2@FL-FMIPs (e) and SiO2@FNIPs (g). TEM images of the SiO2 (b), SiO2-KH570 (d), SiO2@FL-FMIPs (f) and SiO2@FNIPs (h).