Skip to main content
. Author manuscript; available in PMC: 2017 May 10.
Published in final edited form as: ACS Nano. 2016 Feb 15;10(3):3562–3570. doi: 10.1021/acsnano.5b07919

Figure 1.

Figure 1

Layout of the experimental setup for near-field scanning microwave impedance microscopy in liquids. An AFM-type scanning probe is integrated into an AFM setup for probe scanning over the sample surface with control of the probe-sample distance and force. In addition to the sample topography, two more channels—capacitance C and conductance G—are used for mapping and imaging. The capacitance and conductance of the tip-sample system are monitored by a microwave reflectometer operating at a frequency of 3 GHz. The objects under study are enclosed in a capsule filled with a fluid (or gas) and separated from the probe by an ultrathin dielectric membrane transparent for microwave radiation.