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. 2017 Mar 10;7:144. doi: 10.1038/s41598-017-00157-0

Figure 11.

Figure 11

The compositional change at the interface. (a) TEM image of the interface between NiO and CuO; (b) the corresponding EDS element mapping image; (c) EDS line scanning image along the axis orientation as the white line shown in (a).