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. 2017 Apr 27;7:1238. doi: 10.1038/s41598-017-01283-5

Figure 4.

Figure 4

(a) and (d) low magnification bright-field TEM images and the corresponding SAED patterns, (b) and (e) high magnification bright-field TEM images, (c) and (f) STEM images and the elemental distribution mapping of the regions in the boxes for Zr50Cu44.5Al5.5 and Zr50Cu41.5Al5.5Mo3 samples, respectively.