Skip to main content
. 2017 May 2;7:1367. doi: 10.1038/s41598-017-01545-2

Figure 1.

Figure 1

(a) Topography of the Al electrodes observed with AFM showing the effect of temperature on roughness, (b) Lateral cut profile across the AFM images showing increased roughness and grain sizes with T S < 300 °C, (c) SEM images of the Al displaying the increased grain sizes as temperature increases and a mixture of large and small grains at 300 °C and (d) Histogram of the grain size distribution of the Al electrode at different sputtering temperatures. All scale bars in (a,c) represent 400 nm.