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. 2017 May 9;7:1615. doi: 10.1038/s41598-017-01717-0

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© The Author(s) 2017

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Schematic layout of the SXRD experiment. In SXRD the reference system is referred to the sample surface with the x- and y-axes laying on the sample surface while the z-axis is perpendicular to it. The x axis is along the projection in the x,y plane of the incident X-ray beam. The hexagonal surface cell of the Ag(111) is used as orientation matrix during the experiment. The a and b vectors are in the the surface plane while the c vector is parallel to the z-axis. In a SXRD experiment the angle of incidence μ is kept at a constant value (1° in our experiment). Once the orientation matrix of the sample is defined a point of the reciprocal space can be reached by moving the gamma, delta and omega angles. The software takes care of calculating the diffractometer angles for any particular scan in the reciprocal space.