Table 1.

Result of the fit of the XRR data using the stack model described in paper.

		Model 1
Roughness of the substrate	(Å)	3.25 ± 0.02
Thickness of the bottom layer	(Å)	18,84 ± 0.08
Density of the bottom layer	(Å3)	0.0178 ± 0.0001
Roughness of the bottom layer	(Å)	6.54 ± 0.08
Thickness of the top layer	(Å)	—
Density of the top layer	(Å3)	—
Roughness of the top layer	(Å)	—