Table 2.

Comparison between the results of the fitting of the XRR data with the two stack models.

		Model 1	Model 2
Roughness of the substrate	(Å)	3.25 ± 0.02	3.25 ± N/D (Fixed)
Thickness of the bottom layer	(Å)	18,84 ± 0.08	18.84 ± N/D (Fixed)
Density of the bottom layer	(Å3)	0.0178 ± 0.0001	0.0178 ± N/D (Fixed)
Roughness of the bottom layer	(Å)	6.54 ± 0.08	6.54 ± N/D (Fixed)
Thickness of the top layer	(Å)	—	82.59 ± 0.06
Density of the top layer	(Å3)	—	0.0120 ± 0.0007
Roughness of the top layer	(Å)	—	22.42 ± 0.05