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. 2017 Mar 27;77(3):195. doi: 10.1140/epjc/s10052-017-4756-2

Fig. 5.

Fig. 5

Illustration of the background estimation using the Zeeγ method in the 10 GeV < ET < 15 GeV, 0.1 < |η| < 0.8 bin, at reconstruction + track-quality level (left) and for probe electron candidates passing the cut-based Tight identification (right). The background template is normalized in the range 100 GeV < mee < 250 GeV. The tag electron passes cut-based Medium and isolation requirements. The signal MC simulation is scaled to match the estimated signal in the Z-mass window