Figure 8. TEM images taken in bright field mode.

Sample 0.5–1.1. (a) Away from the fault (>1 μm), TEM image showing iron oxides spherulites (S) and disordered weak phase (tl), as products of antigorite dehydration, along with light vesicles (b) detail showing olivine and iron oxides crystals; (c) vesicle within disordered phase in between two olivine grains. (d) FIB section 1; (e) TEM image showing the fault contains vesicles (V), which decrepitate under TEM beam (200 keV) and likely contain dehydration fluids; (f) X-ray diffraction pattern showing nanocrystalline microstructure near the fault interface; (g) X-ray diffraction pattern showing amorphous material surrounding fluid inclusions. (h) TEM image of the FIB section 3; (i) X-ray diffraction pattern in the injectite, showing amorphous material over a surface of ∼10 μm², that is, significantly larger than the fault; (j) euhedral olivine crystals and wetted triple junctions on a side of the injectite, near the fault (holes due to ion beam).