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. 2017 May 25;12:373. doi: 10.1186/s11671-017-2145-2

Fig. 3.

Fig. 3

a Schematic of a mechanically exfoliated SnSe nanoflake FET on a SiO2/p++ Si substrate. b Optical image of a fabricated SnSe nanoflake FET that was used for electrical transport measurements. c AFM image of a SnSe nanoflake on a SiO2/Si substrate. d AFM height profile of a SnSe nanoflake, for estimating the thickness of, and fabricating FET devices