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. 2010 Aug 5;3(8):4196–4213. doi: 10.3390/ma3084196

Figure 4.

Figure 4

SECPM, AFM and CV of Ir(111) and Ir(100): (A1) SECPM image of Ir(111) (500 nm × 500 nm, hmax = 5.5 nm) in 0.1M HClO4 at US = 500 mV vs. NHE and (A2) Contact mode AFM image of Ir(111) obtained in air (1000 nm × 1000 nm, hmax = 5 nm) image of Ir(111) (B1) STM image of Ir(100) in air (500 nm × 500 nm, hmax = nm) and (B2) CVs of Ir(111) and Ir(100) in 1 M HClO4 and 0.01 M HClO4 obtained with a scan rate of 100 mVs-1 and 50 mVs-1 . Imaging conditions: STM: IT = 1 nA, Ubias = 100 mV, SECPM: ∆U = 5 mV.