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. 2013 Oct 25;6(11):4946–4966. doi: 10.3390/ma6114946

Table 2.

Different chemical interfaces tested on the GaAs surface with or without RSA grafting.

N Thiol SAM RSA Characterization methods
1 without without AFM
2 10% MHDA/90% MUDO without
3 without with AFM + MS/MS2
4 0% MHDA/100% MUDO with
5 3% MHDA/97% MUDO with
6 10% MHDA/90% MUDO with
7 20% MHDA/80% MUDO with
8 50% MHDA/50% MUDO with
9 100% MHDA/0% MUDO with