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. 2014 Mar 13;7(3):2155–2182. doi: 10.3390/ma7032155

Figure 7.

Figure 7.

(a) Cyclic voltammograms recorded with the tip of the CAFM on a ZnO/Au stack. The inset shows the schematic of the fabricated device; (b) Evolution of resistances of HRS and LRS in 100 cycles. The resistances were read at 0.5 V in each DC sweep. Reprinted with permission from [79]. Copyright 2012 IEEE.