Figure 12.

(a) Rietveld refinement patterns of NMC synthesized at R = 2 via wet chemical method (R_p = 9.8%). The plus marks show observed X-ray diffraction intensities and the solid line (in red on the web version) represents calculated intensities. The curve at the bottom (in blue on the web version) is the difference between the calculated and observed intensities on the same scale; (b) The concentration of Ni(3b) defects (site-exchange rate of the Li⁺/Ni²⁺ cation mixing) as a function of the R parameter for the symmetric NMC compounds.